Showing results: 151 - 165 of 602 items found.
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800 -
ACL Inc.
The ACL 800 Digital Megohmmeter is a dependable and easy-to-use audit kit that is designed to test static dissipative surfaces for electrical resistivity and resistance according to industry standards such as ANSI/ESD test methods S4.1, S7.1, and ASTM D257. Tests are easy to perform with or without the 5lb probes. Use optional concentric ring probe for conformance to STM11.11.
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Tektronix, Inc.
A high voltage differential probe is used for measuring the voltage difference between two test points where neither test point is at ground. High voltage differential probes from Tektronix can be used for signals up to 6000 V. These probes are the best choice for making non-ground referenced, floating or isolated measurements in large part due to their common mode rejection capability. These products are designed, manufactured, and serviced by Tektronix.
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2100 -
Magnetic Instrumentation Inc.
Magnetic Instrumentation manufactures Hall Effect Probes in a wide range of styles and sizes. Probes are supplied with magnetic, electrical, temperature stability and calibration data for each measurement range. Probe are supplied with flash memory and a temperature sensor that allow the 2100 Gaussmeter to correct for Hall Element inaccuracies due to temperature change. Probes are supplied with a NIST traceable Certificate of Calibration and test data.
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Metal Samples Company
Electrical resistance (ER) corrosion probes are commonly used in petroleum, chemical processing, and other environments where on-line corrosion rate readings are required. Whereas test coupons must be removed from the process for evaluation, corrosion probes can allow corrosion rate determination without probe removal.
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Buckling Beam -
Prospect Products Inc.
Straight wire probe pins are a proven solution for various electronics production test environments.
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Elcometer Limited
This range of telescopic probe handles and extension rods allow you to test out of reach areas.
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Parrot Invent
Kelvin Test Probes, Kelvin Test Leads, based on the Parrot™ Clip Invention provide reliable contacts and connections for the Sense and for the Current leads .
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B-1013 -
ROSS ENGINEERING CORPORATION
*25kV, 50kV or 100kV Meter with integral line to ground Probe*Phasing or line to line with additional Probe*Optional 6ft or 9ft Collapsible Hotsticks*Voltage source for testing Voltmeters and Probes*Optional test point contamination indicating Megmeter®*High voltage cable clamps or hooks*Heavy duty carrying case
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Smiths Interconnect
Smiths Interconnect offers interface probes for all major test equipment manufacturers. We also provide a variety of interface pins for use in test fixtures.
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PB6800 -
Integrated Technology Corp.
The ITC line of Probilt, probe card analyzers provide fast, accurate and repeatable test data for all types of probe card technologies. Simple user definable vision parameters allow even the newest and most complex probe tip geometries to be captured and accurately measured. Probilt’s PB6800 large measurement chuck allows probe arrays as big as 300 mm in diameter to be touched down without overhanging the chuck surface.
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VOL-PBE -
Lisun Electronics Inc.
• EMI Receiver equipped with voltage probe can test disturbance voltage from load terminals or control terminals
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Jandel Engineering Limited
Jandel Engineering Limited manufacture three Test Units designed specifically for four point probe measurements.
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U5404A -
Keysight Technologies
This 18 mm test probe is highly recommended for CAT IV environment and is compatible with the U1281A/82A handheld DMMs
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HS-HCTT -
HenergySolar
It is strictly designed according to the requirements of the hot-probe thermal EMF conductivity type test in standard ASTM F42: Standard Test Methods for Conductivity Type of Extrinsic Semiconductor Materials. A temperature controlling heating element is installed inside the hot probe so that the hot probe is heated automatically and its temperature is maintained in the range 40-60℃.
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Smiths Interconnect
Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.